Kenneth J Li

Title: Innovations of Kenneth J Li

Introduction

Kenneth J Li is a notable inventor based in Rochester, NY (US). He has made significant contributions to the field of technology, particularly in the area of wafer measurement systems. His innovative approach has led to the development of a unique patent that enhances the precision of wafer processing.

Latest Patents

Kenneth J Li holds a patent for a "System for locating and measuring an index mark on an edge of a wafer." This system involves positioning a wafer on a chuck, allowing for accurate measurement of index marks using a laser beam optical profiler. The chuck's ability to translate, tilt, and rotate enables precise data collection, which is crucial for determining the quality of wafers in manufacturing processes.

Career Highlights

Li is currently associated with Chapman Instruments, Inc., where he applies his expertise in developing advanced measurement systems. His work has been instrumental in improving the efficiency and accuracy of wafer inspections, which are vital in semiconductor manufacturing.

Collaborations

One of his notable coworkers is Donald Paul McClimans, with whom he has likely collaborated on various projects within the company.

Conclusion

Kenneth J Li's contributions to wafer measurement technology exemplify the impact of innovative thinking in the field of engineering. His patent reflects a commitment to enhancing manufacturing processes, showcasing the importance of precision in technology.