Company Filing History:
Years Active: 2000-2009
Title: Innovations of Donald Paul McClimans
Introduction
Donald Paul McClimans is a notable inventor based in Fairport, NY (US). He holds a total of 3 patents that showcase his contributions to the field of optical imaging systems and wafer measurement technologies. His work reflects a commitment to advancing technological solutions in these areas.
Latest Patents
One of his latest patents is titled "Method of assembling a composite data map having a closed-form solution." This invention involves stitching together local data maps of an optical imaging system into a composite global data map based on a merit function that supports closed-form processing. The overlapping regions of the local data maps are defined as difference maps, which are given a parametric description. Corrective orientations of the local data maps are derived by collectively matching these parametric descriptions for the overlapping local data maps to the corresponding difference maps.
Another significant patent is the "System for locating and measuring an index mark on an edge of a wafer." In this system, a wafer is positioned and centered on a chuck in a horizontal position, allowing for the accurate measurement of an index mark on the wafer's edge. The chuck is designed to be translatable, tiltable, and rotatable, enabling precise alignment with the index mark orientation features. A laser beam is focused on the wafer's surface to generate data corresponding to the angular location of the index mark edges, ultimately allowing for the computation of the index mark center location.
Career Highlights
Throughout his career, McClimans has worked with several prominent companies, including Chapman Instruments, Inc. and Corning Incorporated. His experience in these organizations has contributed to his expertise in optical systems and measurement technologies.
Collaborations
Some of his notable coworkers include Kenneth J. Li and Silvio P. Marchese-Ragona. Their collaborations have likely enriched the innovative processes and projects they have undertaken together.
Conclusion
Donald Paul McClimans is a distinguished inventor whose patents reflect significant advancements in optical imaging and wafer measurement technologies. His contributions continue to influence the field and inspire future innovations.