The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2009

Filed:

Jun. 30, 2005
Applicants:

Simon Lee, Webster, NY (US);

Donald Paul Mcclimans, Fairport, NY (US);

Mark Joseph Tronolone, Fairport, NY (US);

Inventors:

Simon Lee, Webster, NY (US);

Donald Paul McClimans, Fairport, NY (US);

Mark Joseph Tronolone, Fairport, NY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

Local data maps of an optical imaging system are stitched together into a composite global data map based on a merit function supporting closed-form processing. Overlapping regions of the local data maps are defined as difference maps that are given a parametric description. Corrective orientations of the local data maps are derived by collectively matching parametric descriptions of the corrective orientations for the overlapping local data maps to the parametric descriptions of the corresponding difference maps.


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