Company Filing History:

9 out of 7,268

Corning Incorporated

Years Active: 1994-2017

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14 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9829310 - Interferometric roll-off measurement using a static fringe pattern (2017-11-28),

2. 8531677 - Frequency-shifting interferometer with selective data processing (2013-09-10),

3. 7986414 - Measurement of multiple surface test objects with frequency scanning interferometer (2011-07-26),

4. 7916763 - Current driven frequency-stepped radiation source and methods thereof (2011-03-29),

5. 7593599 - Method of assembling a composite data map having a closed-form solution (2009-09-22),

6. 7286238 - Feature isolation for frequency-shifting interferometry (2007-10-23),

7. 7268889 - Phase-resolved measurement for frequency-shifting interferometry (2007-09-11),

8. 7268887 - Overlapping common-path interferometers for two-sided measurement (2007-09-11),

9. 6781699 - Two-wavelength confocal interferometer for measuring multiple surfaces (2004-08-24),

10. 6757067 - Fringe pattern discriminator for grazing incidence interferometer (2004-06-29),

11. 5724137 - Fringe pattern discriminator for interferometer using diffraction (1998-03-03),

12. 5532821 - Testing of recessed surfaces at grazing incidence (1996-07-02),

13. 5416586 - Method of testing aspherical optical surfaces with an interferometer (1995-05-16),

14. 5349434 - Method of measuring artifact taper (1994-09-20),

Title: Mark Joseph Tronolone: Innovator in Optical Measurement Technologies

Introduction

Mark Joseph Tronolone is a distinguished inventor based in Fairport, NY (US), known for his significant contributions to optical measurement technologies. With a total of 14 patents to his name, Tronolone has developed innovative solutions that enhance the precision of surface contour measurements.

Latest Patents

One of his latest patents is titled "Interferometric roll-off measurement using a static fringe pattern." This invention involves an apparatus designed to measure the surface contour of a target area on a substrate. It utilizes a light source to emit a measurement light beam, with a beam splitting element that defines both a measurement axis and a reference axis. The substrate holder positions the target area along the measurement axis, tilted away from normal incidence according to a predetermined tilt angle based on the measurement light beam wavelength. An imaging sensor captures a fringe pattern generated from both the measurement and reference light beams. A computer then extracts frequency profiles from the recorded fringe pattern, allowing for the computation of changes in the contour of the target area surface.

Another notable patent is the "Frequency-shifting interferometer with selective data processing." This invention is designed for measuring the optical profile of a test object using a continuously tunable light source. It captures a series of interference images of the test object along with the beam frequencies at which these images are formed. A limited selection of these interference images is processed to ensure that the monitored beam frequencies align with a predetermined spacing pattern, facilitating further analysis.

Career Highlights

Throughout his career, Tronolone has worked with prominent companies such as Corning Incorporated and Tropel Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in optical measurement technologies.

Collaborations

Tronolone has collaborated with notable professionals in his field, including Christopher Alan Lee and Thomas James Dunn. These partnerships have fostered innovation and the development of cutting-edge technologies.

Conclusion

Mark Joseph Tronolone's work in optical measurement technologies exemplifies the impact of innovative thinking in engineering. His patents reflect a commitment to advancing measurement techniques, making significant contributions to the field.

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