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Fairport, NY, United States of America

Tropel Corporation

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USPTO Granted Patents = 24

Trademarks = 2

Forward Citations = 556

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19 inventors (with patents filed for the assignee):

John H Bruning (10 out of 30 patents)

Andrew W Kulawiec (6 out of 14 patents)

Mark Joseph Tronolone (4 out of 14 patents)

4. James E Platten (4 out of 5 patents)

5. Paul Francis Michaloski (3 out of 26 patents)

6. Paul Gerard Dewa (3 out of 19 patents)

7. Jon F Fleig (3 out of 3 patents)

8. Anthony R Phillips, Jr (2 out of 3 patents)

9. Chunsheng J Huang (2 out of 9 patents)

10. James Edson Webb (1 out of 7 patents)

11. C Theodore Tienvieri (1 out of 1 patent)

12. Dag Lindquist (1 out of 2 patents)

13. David R Shafer (1 out of 86 patents)

14. Bryan D Stone (1 out of 1 patent)

15. Steven J VanKerkhove (1 out of 2 patents)

24 patents: Sort by Forward Citations

1. 6560039 - Double mirror catadioptric objective lens system with three optical surface multifunction component (2003-05-06),

2. 6456384 - Moiré interferometer with overlapping illumination and imaging systems (2002-09-24),

3. 6191887 - Laser illumination with speckle reduction (2001-02-20),

4. 6043886 - Interferometric method of measuring toric surfaces at grazing incidence (2000-03-28),

5. 5991035 - Interferometric method of measuring toric surfaces at grazing incidence (1999-11-23),

6. 5982475 - Raster-scan photolithographic reduction system (1999-11-09),

7. 5923425 - Grazing incidence interferometry for measuring transparent (1999-07-13),

8. 5909282 - Interferometer for measuring thickness variations of semiconductor wafers (1999-06-01),

9. 5909281 - Interferometric measurement of surfaces with diffractive optics and (1999-06-01),

10. 5889591 - Interferometric measurement of toric surfaces at grazing incidence (1999-03-30),

11. 5793488 - Interferometer with compound optics for measuring cylindrical objects at (1998-08-11),

12. 5777738 - Interferometric measurement of absolute dimensions of cylindrical (1998-07-07),

13. 5757493 - Interferometer with catadioptric imaging system having expanded range of (1998-05-26),

14. 5724137 - Fringe pattern discriminator for interferometer using diffraction (1998-03-03),

15. 5719676 - Diffraction management for grazing incidence interferometer (1998-02-17),

Company Overview

Tropel Corporation, based in Fairport, NY, specializes in the design and manufacture of precision optical components and systems. The company focuses on advanced optical technologies, providing innovative solutions for various applications, including imaging systems and optical instruments. Tropel is recognized for its expertise in metrology and optical engineering, catering to industries such as semiconductor, aerospace, and defense. Their commitment to quality and precision positions them as a key player in the optical technology landscape.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

24 Patents

#4 in Fairport, NY

#827 in New York

#13,900 in US

#26,701 in the World

Fairport, NY, United States of America

Tropel Corporation

Forward Citations = 556

19 inventors:

John H Bruning (10 out of 30 patents)

Andrew W Kulawiec (6 out of 14 patents)

Mark Joseph Tronolone (4 out of 14 patents)

4. James E Platten (4 out of 5 patents)

5. Paul Francis Michaloski (3 out of 26 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Tropel Corporation. Retrieved from https://idiyas.com/company/tropel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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