The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 1998

Filed:

Oct. 16, 1996
Applicant:
Inventor:

Steven J VanKerkhove, Rochester, NY (US);

Assignee:

Tropel Corporation, Fairport, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356359 ; 356360 ; 359487 ; 359727 ;
Abstract

A catadioptric imaging system for an interferometer includes a beamsplitter plate for reflecting a beam of light to a concave mirror for transmitting reflected light from the mirror. The beamsplitter reflections and transmissions produce opposite sign spherical aberrations. A refractive optic is located between the beamsplitter plate and a convex test surface for removing residual spherical aberrations and for permitting more variability in the positioning of the beamsplitter plate. Design variables for both the refractive optic and the position of the beamsplitter plate can be used to adjust a numerical aperture of the beam approaching the test surface. The refractive optic can also be used as a Fizeau objective to further reduce errors in the imaging system.


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