Company Filing History:
Years Active: 1994-1998
Title: The Innovations of Jon F Fleig
Introduction
Jon F Fleig is a notable inventor based in Rochester, NY (US), recognized for his contributions to optical technology. He holds three patents that showcase his expertise in interferometry and optical surface testing. His work has significantly advanced the field, providing innovative solutions for complex optical measurements.
Latest Patents
One of Jon F Fleig's latest patents is the "Fringe pattern discriminator for interferometer using diffraction." This invention allows for the distinction of object fringe patterns from other patterns in an interferogram produced by an interferometer. By utilizing a pair of diffraction gratings, the test and reference beams are separated and recombined. The object under test is moved in X and Y directions, changing the brightness regions of the object fringe pattern. A computer identifies pixels whose irradiance changes in response to the object's movement, ensuring that only relevant data is used for analyzing the interferogram, ultimately producing a precise measurement of the object's surface.
Another significant patent is the "Method of testing aspherical optical surfaces with an interferometer." This method employs a Fizeau interferometer to produce spherical test and reference wavefronts. It operates with a linear translator to make a sequence of subaperture measurements of an aspherical test surface. Separate phase maps are assembled at different focus positions along a common optical axis, isolating respective null zones to form a composite phase map that defines the differences between the aspherical test surface and a family of spheres.
Career Highlights
Throughout his career, Jon F Fleig has worked with prominent companies such as Tropel Corporation and QED Technologies International, Inc. His experience in these organizations has allowed him to refine his skills and contribute to significant advancements in optical technology.
Collaborations
Jon has collaborated with notable individuals in his field, including Mark Joseph Tronolone and Chunsheng J Huang. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Jon F Fleig's contributions to the field of optical technology through his patents and collaborations highlight his role as a significant inventor. His work continues to influence advancements in interferometry and optical surface testing.