The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2013
Filed:
May. 18, 2011
Thomas James Dunn, Penfield, NY (US);
Christopher Alan Lee, Pittsford, NY (US);
Mark Joseph Tronolone, Webster, NY (US);
Thomas James Dunn, Penfield, NY (US);
Christopher Alan Lee, Pittsford, NY (US);
Mark Joseph Tronolone, Webster, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
A frequency-shifting interferometer is arranged for measuring an optical profile of a test object with a continuously tunable light source. A succession of the interference images of the test object are captured together with a measure of the beam frequencies at which interference images are formed. A limited number of the captured interference images of the test object are selected so that the monitored beam frequencies approximately match a predetermined beam frequency spacing pattern. Further processing proceeds based on the selected interference images.