The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Sep. 22, 2004
Andrew Kulawiec, Fairport, NY (US);
Joseph C. Marron, Pittsford, NY (US);
Don Mcclimans, Fairport, NY (US);
Mark J. Tronolone, Fairport, NY (US);
Andrew Kulawiec, Fairport, NY (US);
Joseph C. Marron, Pittsford, NY (US);
Don McClimans, Fairport, NY (US);
Mark J. Tronolone, Fairport, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
A frequency-shifting interferometer gathers intensity data from a set of interference patterns produced at different measuring beam frequencies. A periodic function is matched to the intensity data gathered from the set of interference patterns over a corresponding range of measuring beam frequencies. Localized correlations involving phase offsets between the interfering portions of the measuring beam are used to inform a determination of a rate of phase change with measuring beam frequency corresponding to the optical path length difference between the interfering beam portions.