Company Filing History:
Years Active: 2007
Title: The Innovative Contributions of Don McClimans
Introduction
Don McClimans is a notable inventor based in Fairport, NY (US). He has made significant contributions to the field of interferometry, particularly with his innovative patent that addresses frequency-shifting measurement techniques. His work has implications for various applications in optical engineering and measurement technologies.
Latest Patents
One of Don McClimans' key patents is titled "Phase-resolved measurement for frequency-shifting interferometry." This patent describes a frequency-shifting interferometer that gathers intensity data from a set of interference patterns produced at different measuring beam frequencies. A periodic function is matched to the intensity data gathered from the set of interference patterns over a corresponding range of measuring beam frequencies. Localized correlations involving phase offsets between the interfering portions of the measuring beam are utilized to inform a determination of a rate of phase change with measuring beam frequency, which corresponds to the optical path length difference between the interfering beam portions. This innovative approach enhances the accuracy and efficiency of measurements in optical systems.
Career Highlights
Don McClimans is associated with Corning Incorporated, a leading company known for its advanced materials and technologies. His work at Corning has allowed him to contribute to cutting-edge research and development in optical technologies. With a focus on precision and innovation, McClimans has established himself as a valuable asset in his field.
Collaborations
Throughout his career, Don has collaborated with esteemed colleagues such as Andrew W Kulawiec and Joseph C Marron. These collaborations have fostered a productive environment for innovation and have led to advancements in their respective areas of expertise.
Conclusion
Don McClimans exemplifies the spirit of innovation through his contributions to frequency-shifting interferometry. His patent and work at Corning Incorporated highlight the importance of precision in optical measurements. His collaborations further enhance the impact of his inventions in the field.
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