The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Dec. 23, 2004
Andrew W. Kulawiec, Fairport, NY (US);
Mark J. Tronolone, Fairport, NY (US);
Thomas J. Dunn, Penfield, NY (US);
Joseph C. Marron, Pittsford, NY (US);
Andrew W. Kulawiec, Fairport, NY (US);
Mark J. Tronolone, Fairport, NY (US);
Thomas J. Dunn, Penfield, NY (US);
Joseph C. Marron, Pittsford, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
Two common-path interferometers share a measuring cavity for measuring opposite sides of opaque test parts. Interference patterns are formed between one side of the test parts and the reference surface of a first of the two interferometers, between the other side of the test parts and the reference surface of a second of the two interferometers, and between the first and second reference surfaces. The latter measurement between the reference surfaces of the two interferometers enables the measurements of the opposite sides of the test parts to be related to each other.