Rochester, NY, United States of America

Matthew E Seelig

This inventor holds 2 USPTO granted patents. Top assignee: Chapman Instruments, Inc.. Active years: 1999-2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew E Seelig. Retrieved from https://idiyas.com/inventor/matthew-e-seelig-ujgwrwa9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.2

ph-index = 2

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 1999-2000

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2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Matthew E. Seelig

Introduction

Matthew E. Seelig is a notable inventor based in Rochester, NY (US). He has made significant contributions to the field of optical measurement systems, holding 2 patents that showcase his expertise and innovative spirit. His work primarily focuses on automated systems that enhance the precision and efficiency of surface profile measurements.

Latest Patents

Seelig's latest patents include an "Automated Optical Surface Profile Measurement System" and a "Wafer Holding and Orienting Fixture for Optical Profilometry." The automated system is designed to streamline the process of measuring the surface profiles of wafers. It features a loading chamber and a measurement chamber equipped with a phase differential laser optical scanning system. The system utilizes a five-axis positioner that can hold and orient wafers for accurate measurements. Each motion of the positioner is motor-driven, allowing for independent or compound movements as required. The robotic server within the system automates the selection and transfer of wafers, ensuring efficient operation.

The second patent, the wafer holding and orienting fixture, is an optical profilometer that measures the profile of a wafer's surface using an optical beam. This fixture includes a frame that allows for the orientation and pivotal rotation of the wafer, accommodating various diameters. A vacuum chuck secures the wafer in place, while an actuator enables angular positioning for precise profile measurements.

Career Highlights

Matthew E. Seelig is currently employed at Chapman Instruments, Inc., where he continues to develop innovative solutions in optical measurement technology. His work has significantly advanced the capabilities of profilometry, making it more efficient and accurate.

Collaborations

Seelig has collaborated with notable colleagues such as Silvio P. Marchese-Ragona and Robert Bryant, contributing to the development of cutting-edge technologies in his field.

Conclusion

Matthew E. Seelig's contributions to optical measurement systems exemplify his innovative approach and dedication to advancing technology. His patents reflect a commitment to improving the efficiency and accuracy of surface profile measurements, making a lasting impact in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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