This inventor holds 2 USPTO granted patents. Top assignee: Chapman Instruments, Inc.. Active years: 1999-2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1999-2000
Title: Silvio P Marchese-Ragona: Innovator in Optical Profilometry
Introduction
Silvio P Marchese-Ragona is a notable inventor based in Rochester, NY (US). He has made significant contributions to the field of optical profilometry, holding 2 patents that showcase his innovative approach to surface measurement technology.
Latest Patents
Marchese-Ragona's latest patents include an "Automated Optical Surface Profile Measurement System" and a "Wafer Holding and Orienting Fixture for Optical Profilometry." The automated system is designed to fully automate the surface profiling process, featuring a loading chamber and a measurement chamber equipped with a phase differential laser optical scanning system. This system utilizes a five-axis positioner with a vacuum chuck to hold and orient wafers for precise surface profile measurements. The positioner can perform various motions independently or in combination, accommodating different wafer sizes through replaceable chucks. The entire operation is controlled by a programmable CPU, allowing for efficient testing and data analysis.
The wafer holding fixture is designed for measuring the profile of a wafer's surface using an optical beam. It includes a frame that can pivotally rotate the wafer and a vacuum chuck to secure it in place. An actuator allows for angular positioning of the fixture frame, enabling the measurement of various surfaces of the wafer, including edges and bevels.
Career Highlights
Marchese-Ragona is currently associated with Chapman Instruments, Inc., where he continues to develop innovative solutions in optical measurement technology. His work has significantly advanced the capabilities of surface profiling systems, making them more efficient and versatile.
Collaborations
He has collaborated with notable coworkers such as Matthew E Seelig and Robert Bryant, contributing to the development of cutting-edge technologies in his field.
Conclusion
Silvio P Marchese-Ragona's contributions to optical profilometry through his patents and work at Chapman Instruments, Inc. highlight his role as a leading innovator in the industry. His inventions are paving the way for advancements in surface measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile