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For the Inventor, By the Inventor

San Mateo, CA, United States of America

Zain Saidin

This inventor holds 14 USPTO granted patents and 1 published patent application, primarily in Wafer Defect Detection. Top assignees: Kla-Tencor Technologies Corporation, Kla Tencor Corporation. Active years: 2000-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zain Saidin. Retrieved from https://idiyas.com/inventor/zain-saidin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 14 

% Patents Active = 71.4

Average Co-Inventor Count = 4.3

ph-index = 8

Forward Citations = 297(Granted Patents)


Location History:

  • Sunnyvale, CA (US) (2000 - 2004)
  • San Mateo, CA (US) (2005 - 2017)

Company Filing History:

goldMedal8 out of 641 
 
Kla-Tencor Technologies Corporation
 patents
silverMedal6 out of 1,787 
 
Kla Tencor Corporation
 patents

Years Active: 2000-2017

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Areas of Expertise:
Wafer Inspection
Defect Detection
Reticle Design
Optical Properties
Critical Dimension
Process Monitoring
Defect Sensitivity
Optical Aberrations
Patterned Wafer
Prediction Model
Defect Review
Registration
14 patents (USPTO):Explore Patents
1. 9710903 - System and method for detecting design and process defects on a wafer using process monitoring features (2017-07-18),
2. 8804137 - Unique mark and method to determine critical dimension uniformity and registration of reticles combined with wafer overlay capability (2014-08-12),
3. 7904845 - Determining locations on a wafer to be reviewed during defect review (2011-03-08),
4. 7646906 - Computer-implemented methods for detecting defects in reticle design data (2010-01-12),
5. 7440093 - Apparatus and methods for providing selective defect sensitivity (2008-10-21),
6. 7303842 - Systems and methods for modifying a reticle's optical properties (2007-12-04),
7. 7300729 - Method for monitoring a reticle (2007-11-27),
8. 7300725 - Method for determining and correcting reticle variations (2007-11-27),
9. 7297453 - Systems and methods for mitigating variances on a patterned wafer using a prediction model (2007-11-20),
10. 7271891 - Apparatus and methods for providing selective defect sensitivity (2007-09-18),
11. 6844927 - Apparatus and methods for removing optical abberations during an optical inspection (2005-01-18),
12. 6731787 - System and method for determining reticle defect printability (2004-05-04),
13. 6381358 - System and method for determining reticle defect printability (2002-04-30),
14. 6076465 - System and method for determining reticle defect printability (2000-06-20),

Title: The Innovative Mind of Zain Saidin

Introduction: Zain Saidin, a talented inventor based in San Mateo, CA, is known for his groundbreaking contributions to the field of technology and beyond.

Latest Patents: Zain Saidin holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of interests and expertise.

Career Highlights: With a background in engineering and a passion for problem-solving, Zain Saidin has had a successful career marked by innovative solutions that have had a positive impact on various industries.

Collaborations: Throughout his career, Zain Saidin has collaborated with leading tech companies, research institutions, and universities to bring his inventions to life and push the boundaries of what is possible.

Conclusion: Zain Saidin's relentless pursuit of innovation and his ability to think outside the box make him a true pioneer in the world of inventions, with a promising future ahead.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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