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For the Inventor, By the Inventor

Sayama, Japan

Yoshinori Nakayama

USPTO Granted Patents = 63 

 

Average Co-Inventor Count = 3.6

ph-index = 12

Forward Citations = 576(Granted Patents)

Forward Citations (Not Self Cited) = 570(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Sayama, JP (1988 - 2015)
  • Tokyo, JP (1999 - 2022)

Company Filing History:

goldMedal32 out of 42,508 
 
Hitachi, Ltd.
 patents
silverMedal28 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal11 out of 90,753 
 
Canon Kabushiki Kaisha
 patents
4. 2 out of 2,253 
 
Adv Antest Corporation
 patents
5. 1 out of 1,134 
 
Hitachi High-Tech Corporation
 patents
6. 2 out of 832,880 
Other
 patents
where one patent can have more than one assignee

Years Active: 1988-2022

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Areas of Expertise:
Electron Beam Adjustment
Calibration Method
Charged Particle Beam
Scanning Electron Microscope
Defect Inspection
Ion Beam System
Lithography Apparatus
Measurement Device
Pattern Forming Method
Metrology System
Device Manufacturing Method
Electron Beam Writing
63 patents (USPTO):Explore Patents
1. 11435178 - Calibration sample, electron beam adjustment method and electron beam apparatus using same (2022-09-06),
2. 10438771 - Measurement device, calibration method of measurement device, and calibration member (2019-10-08),
3. 9200896 - Pattern dimension measurement method and charged particle beam microscope used in same (2015-12-01),
4. 9110384 - Scanning electron microscope (2015-08-18),
5. 8735816 - Standard member for calibration and method of manufacturing the same and scanning electron microscope using the same (2014-05-27),
6. 8478021 - Charged beam device (2013-07-02),
7. 8373113 - Calibration standard member, method for manufacturing the member and scanning electronic microscope using the member (2013-02-12),
8. 8268209 - Pattern forming method and its mold (2012-09-18),
9. 8263929 - Standard member for correction, scanning electron microscope using same, and scanning electron microscope correction method (2012-09-11),
10. 8064681 - Method and apparatus for inspecting reticle (2011-11-22),
11. 7952083 - Ion beam system and machining method (2011-05-31),
12. 7947964 - Charged particle beam orbit corrector and charged particle beam apparatus (2011-05-24),
13. 7943903 - Defect inspection method and its system (2011-05-17),
14. 7875850 - Standard component for calibration and electron-beam system using the same (2011-01-25),
15. 7834997 - Standard component for calibration and calibration method using it and electro beam system (2010-11-16),

Title: Yoshinori Nakayama: Pioneering Inventor from Sayama

Introduction: Yoshinori Nakayama is a renowned inventor hailing from Sayama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Yoshinori Nakayama holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Nakayama has worked with leading tech companies in Japan, spearheading projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Yoshinori Nakayama has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge-sharing.

Conclusion: Yoshinori Nakayama's passion for innovation and his relentless drive to push the boundaries of what is possible make him a true pioneer in the world of inventions, inspiring the next generation of inventors to dream big and create a better future.

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