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For the Inventor, By the Inventor

Fuchu, Japan

Yasuhiro Mitsui

This inventor holds 39 USPTO granted patents and 1 EPO patent, primarily in Micro Sample Processing. Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Hitachi Tokyo Electronics Co., Ltd.. Active years: 1988-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasuhiro Mitsui. Retrieved from https://idiyas.com/inventor/yasuhiro-mitsui

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 39

% Patents Active = 89.7


Average Co-Inventor Count = 5.0

ph-index = 17

Forward Citations = 777(Granted Patents)


Location History:

  • Fuchuu, JP (1996 - 2006)
  • Tokyo, JP (2007)
  • Fuchu, JP (1988 - 2013)

Company Filing History:

goldMedal29 out of 42,726 
 
Hitachi, Ltd.
 patents
silverMedal8 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal4 out of 21 
 
Hitachi Tokyo Electronics Co., Ltd.
 patents
4. 1 out of 4,980 
 
Oki Electric Industry Co., Ltd.
 patents
5. 1 out of 3,781 
 
Renesas Technology Corp.
 patents
where one patent can have more than one assignee

Years Active: 1988-2013

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Areas of Expertise:
Micro Sample Processing
Electron Microscope
Defect Inspection
Micropattern Measurement
X-Ray Analysis
Mass Spectrometer
Surface Analysis
Gas Analyzer
Test Element Groups
Probe Positioning
Atomic Arrangement Observation
Atmospheric Pressure Ionization
39 patents (USPTO):Explore Patents
1. 8618520 - Method and apparatus for processing a micro sample (2013-12-31),
2. 8222618 - Method and apparatus for processing a microsample (2012-07-17),
3. 8178840 - Specimen inspection equipment and how to make the electron beam absorbed current images (2012-05-15),
4. 8074293 - Defective product inspection apparatus, probe positioning method and probe moving method (2011-12-06),
5. 7888639 - Method and apparatus for processing a micro sample (2011-02-15),
6. 7663104 - Specimen inspection equipment and how to make electron beam absorbed current images (2010-02-16),
7. 7553334 - Defective product inspection apparatus, probe positioning method and probe moving method (2009-06-30),
8. 7550750 - Method and apparatus for processing a micro sample (2009-06-23),
9. 7470918 - Method and apparatus for processing a micro sample (2008-12-30),
10. 7465945 - Method and apparatus for processing a micro sample (2008-12-16),
11. 7297945 - Defective product inspection apparatus, probe positioning method and probe moving method (2007-11-20),
12. 7222235 - Image processing system utilizing digital watermarks in predetermined regions (2007-05-22),
13. 7205560 - Method and apparatus for processing a micro sample (2007-04-17),
14. 7205554 - Method and apparatus for processing a micro sample (2007-04-17),
15. 7130063 - Micropattern shape measuring system and method (2006-10-31),

Title: The Innovative Journey of Inventor Yasuhiro Mitsui

Introduction: Yasuhiro Mitsui, a talented inventor hailing from Fuchu, Japan, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Yasuhiro Mitsui holds several patents in the field of robotics and artificial intelligence, with his most recent inventions focusing on advanced human-robot interaction systems.

Career Highlights: With a career spanning over two decades, Yasuhiro Mitsui has worked with leading tech companies in Japan, spearheading research and development projects that have pushed the boundaries of innovation.

Collaborations: Throughout his career, Yasuhiro Mitsui has collaborated with top researchers and engineers in the industry, fostering a culture of creativity and excellence in all his projects.

Conclusion: Yasuhiro Mitsui's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and engineers worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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