Nussloch, Germany

Volker Seyfried

USPTO Granted Patents = 46 

 

Average Co-Inventor Count = 2.0

ph-index = 7

Forward Citations = 154(Granted Patents)


Company Filing History:


Years Active: 2005-2024

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Areas of Expertise:
Interferometric Measurement
Fluorescence Imaging Microscopy
Raman Microscopic Imaging
Acousto-Optical Components
Scanning Microscopy
Optical Beam Adjustment
Photosensor Chip Technology
High Spatial Resolution Imaging
Laser Light Generation
Optical Evaluation Methods
Detection Devices
Microscopic Sample Analysis
46 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Volker Seyfried

Introduction

Volker Seyfried, a prominent inventor based in Nussloch, Germany, has made significant contributions to the field of interferometry and optical measurement technologies. With a prolific portfolio of 46 patents, his work continues to influence advancements in scientific and industrial applications.

Latest Patents

Among Seyfried's latest innovations are an interferometric measurement device and an interferometric method for determining the surface topography of a measurement object. This invention introduces an advanced approach that utilizes light intensities from multiple detector elements to enhance measurement precision. Additionally, he has developed a microscope that employs an acousto-optic beam combiner. This innovative beam combiner integrates two illuminating light bundles of the same wavelength but differing polarizations, showcasing his skill in combining optics and mechanical waves for superior functionality.

Career Highlights

Volker Seyfried has established a notable career at Leica Microsystems, working for both Leica Microsystems CMS GmbH and Leica Microsystems Heidelberg GmbH. His tenure at these companies has underscored his expertise in optical instruments and measurement technologies, further solidifying his standing as an influential inventor in the field.

Collaborations

Throughout his career, Seyfried has collaborated with esteemed colleagues, including Holger Birk and Rafael Storz. These partnerships have fostered a creative environment, driving the exchange of innovative ideas and enhancing the development of cutting-edge technologies.

Conclusion

In summary, Volker Seyfried stands out as a significant figure in the realm of optical measurement and interferometry. His 46 patents reflect a deep commitment to innovation, showcasing his ability to tackle complex challenges in the scientific community. As he continues to push the boundaries of technology, his contributions will undoubtedly resonate within various industries for years to come.

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