The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Jun. 13, 2012
Applicant:
Volker Seyfried, Nussloch, DE;
Inventor:
Volker Seyfried, Nussloch, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); H04N 7/18 (2006.01); G02B 21/36 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01N 21/6408 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01);
Abstract
A microscope for fluorescence imaging microscopy, in particular for wide-field fluorescence microscopy, including a pulsed light source () and an imaging detector (), is characterized in that means for gating are provided, and in that the gating causes the light source () and the detector () to be synchronized in order to suppress reflected/scattered light such that suitable fluorescence components are used for evaluation and unsuitable components are rejected. Furthermore, a method is used to perform fluorescence imaging microscopy using the microscope according to the present invention.