The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Aug. 11, 2008
Applicants:
Volker Seyfried, Nussloch, DE;
Hilmar Gugel, Dossenheim, DE;
Carsten L. Thomsen, Virum, DK;
Inventors:
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/08 (2006.01); H01S 3/131 (2006.01); H01S 4/00 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01);
Abstract
The invention relates to a method and a device for illuminating or irradiating an object, a sample (), or the like, for the purpose of imaging or analysis, particularly for use in a laser microscope (), preferably in a confocal microscope having a laser light source () emitting the illuminating light, the laser light being coupled directly or by means of a glass fiber into an illumination light path (), characterized in that the laser light source () is switched on rapidly upon a trigger signal directly prior to the actual need, for example, directly prior to imaging.