The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Sep. 03, 2014
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Volker Seyfried, Nussloch, DE;
Vishnu Vardhan Krishnamachari, Seeheim-Jugenheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The invention relates to a microscope having an acousto-optic apparatus () that, with a mechanical wave that is characterized by a preferably adjustable frequency, removes from a polychromatic and collinear detected light bundle () portions of illuminated light, scattered and/or reflected at a sample, having an illuminating light wavelength associated with the frequency. The microscope is notable for the fact that a crystal () of the acousto-optic apparatus in which the mechanical wave propagates, and the propagation direction of the mechanical wave, are oriented relative to the detected light bundle incident into the crystal in such a way that the acousto-optic apparatus deflects, with the mechanical wave, both the portion of the detected light bundle having the illuminating wavelength and a first linear polarization direction, and the portion of the detected light bundle having the illuminating wavelength and a second linear polarization direction perpendicular to the first polarization direction, and thereby removes them from the detected light bundle.