The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Nov. 19, 2014
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Vishnu Vardhan Krishnamachari, Seeheim-Jugenheim, DE;
Volker Seyfried, Nussloch, DE;
William C. Hay, Heppenheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A Raman microscopy imaging device () is described, having: a first laser light source () for emitting a first laser beam () having a first wavelength along a first light path (); a second laser light source () for emitting a second laser beam () having a second wavelength, different from the first wavelength, along a second light path () physically separated from the first light path (); a beam combining element () for collinearly combining the two laser beams () in one shared light path () directed onto a sample; a detector () for sensing a measured signal on the basis of the two laser beams () interacting with the sample; and an evaluation unit () for evaluating the measured signal sensed by the detector (). According to the present invention the first laser light source () is embodied as a pulsed source, and the second laser light source () as a continuous source.