The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Sep. 03, 2014
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Volker Seyfried, Nussloch, DE;

Vishnu Vardhan Krishnamachari, Seeheim-Jugenheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/12 (2006.01); G02B 21/00 (2006.01); G02B 27/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/1256 (2013.01); G02B 21/0032 (2013.01); G02B 21/0064 (2013.01); G02B 27/283 (2013.01);
Abstract

The invention relates to a beam combiner for a microscope, in particular a scanning microscope, which receives at least a first illuminating light bundle and a second illuminating light bundle and combines them into a collinear output light bundle, the first illuminating light bundle and the second illuminating light bundle having the same illuminating light wavelength but a different polarization, in particular linear polarization. The beam combiner is embodied as an acousto-optic beam combiner and is constructed and operated in such a way that by interaction with at least one mechanical wave, both the first illuminating light bundle and the second illuminating light bundle are diffracted and are thereby directed into a common optical axis.


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