The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Feb. 11, 2011
Bernd Widzgowski, Dossenheim, DE;
Holger Birk, Meckesheim, DE;
Volker Seyfried, Nussloch, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A device in the form of a scanning microscope, a device in the form of a structural unit for a microscope and a method and a device for optically scanning one or more samples. A device in the form of a scanning microscope has a light source (), which emits an illuminating light beam (). A focusing lens system () focuses the illuminating light beam () on a region to be examined of a sample (). An actuator arrangement moves the focusing lens system () according to a prescribed scanning pattern transversely in relation to a center axis of the illuminating light beam () and/or in relation to a housing of a structural unit () that encloses the focusing lens system ().