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Waldbronn, Germany

Polytec Gmbh

USPTO Granted Patents = 27

% Expired Patents = 18.5

EPO Patents = 8

Trademarks = 11

Forward Citations = 111

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30 inventors (with patents filed for the assignee):

Christian Rembe (15 out of 15 patents)

Matthias Schussler (6 out of 6 patents)

Alexander Drabenstedt (6 out of 6 patents)

4. Bernd Armbruster (4 out of 4 patents)

5. Bernd Heinen (2 out of 2 patents)

6. Thian-Hua Xu (2 out of 2 patents)

7. Sebastian Boedecker (2 out of 2 patents)

8. Alexander Dräbenstedt (2 out of 2 patents)

9. Georg Siegmund (2 out of 2 patents)

10. Tobias Haist (2 out of 3 patents)

11. Matthias Schüssler (2 out of 2 patents)

12. Michael Wörtge (2 out of 2 patents)

13. Yves Lecorre (2 out of 2 patents)

14. Volker Seyfried (1 out of 46 patents)

15. Robert Kowarsch (1 out of 1 patent)

Core Competencies:

Interferometric Measurement

Vibration Analysis

Optical Measurement

Surface Topography

Laser Beam

Non-Contact Measurement

Heterodyne Interferometer

Scanning Microscope

Vibrometer

Measurement Device

Optical Assembly

Multiphase Flow

27 patents: Sort by Forward Citations

1. 12345563 - Method and apparatus for interferometric vibration measurement at a plurality of measurement points by means of a measuring laser beam (2025-07-01),

2. 12104896 - Interferometric measurement device and interferometric method for determining the surface topography of a measurement object (2024-10-01),

3. 12066321 - Method for determining the path of a measurement beam of an interferometric measuring device, and measuring device for interferometric measurement of an object under measurement (2024-08-20),

4. 11333485 - Alignment method for a beam-directing unit of an interferometric measuring device, and measuring device for carrying out an interferometric measurement by means of laser radiation (2022-05-17),

5. 10018460 - Interferometric measuring device with detectors set at different angular ranges (2018-07-10),

6. 9910056 - Device and method for an interferometric measuring of an object (2018-03-06),

7. 9851243 - Method and device for the optical non-contact oscillation measurement of an oscillating object (2017-12-26),

8. 9638513 - Device and method for the interferometric measuring of an object (2017-05-02),

9. 9551726 - Device and method for an interferometric measuring of an object (2017-01-24),

10. 9212896 - Optical interferometer and vibrometer comprising such an optical interferometer (2015-12-15),

11. 9207227 - Composition of multiphase flow (2015-12-08),

12. 8913247 - Device and method for interferometric vibration measurement of an object (2014-12-16),

13. 8199331 - Vibrometer and method for optically measuring an object (2012-06-12),

14. 8115933 - Interferometer for optically measuring an object (2012-02-14),

15. 8111403 - Method and device for non-contact oscillation measurements (2012-02-07),

Company Overview

Polytec GmbH, headquartered in Waldbronn, Germany, specializes in high-precision measurement technology and optical systems. The company is renowned for its innovative solutions in fields such as laser Doppler vibrometry, optical coherence tomography, and non-destructive testing. Polytec's technologies are widely applied across various industries, including automotive, aerospace, and materials science, supporting advancements in research and development through precise measurement and analysis capabilities.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

27 Patents

#1 in Waldbronn

#1,739 in Germany

#23,984 in the World

Waldbronn, Germany

Polytec Gmbh

Forward Citations = 111

30 inventors:

Christian Rembe (15 out of 15 patents)

Matthias Schussler (6 out of 6 patents)

Alexander Drabenstedt (6 out of 6 patents)

4. Bernd Armbruster (4 out of 4 patents)

5. Bernd Heinen (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Polytec Gmbh. Retrieved from https://idiyas.com/company/polytec

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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