The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2012
Filed:
Apr. 28, 2010
Christian Rembe, Waldbronn, DE;
Tobias Haist, Stuttgart, DE;
Christian Rembe, Waldbronn, DE;
Tobias Haist, Stuttgart, DE;
Polytec GmbH, Waldbronn, DE;
Abstract
An interferometer for optically measuring an object (), including a light source (), at least one beam splitter () and at least one detector (), with the beam splitter being arranged in the beam path of the light source such that a light beam created by the light source is split into a working beam () and a reference beam (). The interferometer is embodied such that the working beam impinges on the object () to be measured and the working beam is at least partially reflected by the object and interfered with the reference beam on the detector (). Here it is essential that the interferometer is provided with a spatial light modulator, which comprises a hologram control unit () and a hologram reconstruction unit () connected thereto, with the hologram reconstruction unit being arranged in the beam path of the working beam between the beam splitter () and the object () and the hologram control unit () controlling the hologram reconstruction unit () such that the hologram reconstruction unit creates an optionally predetermined hologram such that the working beam is deflected and/or split by the hologram reconstruction unit.