The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2022
Filed:
Jun. 05, 2019
Applicant:
Polytec Gmbh, Waldbronn, DE;
Inventors:
Assignee:
Polytec GmbH, Waldbronn, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02055 (2022.01); G01S 17/894 (2020.01); G01B 11/24 (2006.01); G01B 11/25 (2006.01); G01H 9/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02068 (2013.01); G01B 11/2441 (2013.01); G01B 11/25 (2013.01); G01H 9/00 (2013.01); G01S 17/894 (2020.01);
Abstract
An alignment method for a beam-directing unit of an interferometric measuring device for directing a laser beam of a laser beam source towards a plurality of measurement points of an object under measurement, wherein a three-dimensional model of a measurement surface of an object under measurement is created by a plurality of spatially resolved images. A measuring device for carrying out an interferometric measurement by laser radiation is also provided, having a controller which is designed to align a beam-directing unit of the measurement device.