The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Oct. 19, 2010
Christian Rembe, Waldbronn, DE;
Alexander Dräbenstedt, Ettlingen, DE;
Michael Gartner, Bühl, DE;
Mike Herberich, Karlsbad, DE;
Andreas Leonhardt, Bretten, DE;
Christian Rembe, Waldbronn, DE;
Alexander Dräbenstedt, Ettlingen, DE;
Michael Gartner, Bühl, DE;
Mike Herberich, Karlsbad, DE;
Andreas Leonhardt, Bretten, DE;
Polytec GmbH, Waldbronn, DE;
Abstract
A device for interferometric vibration measurement, having a radiation source for generating an original beam, a first beam splitter for dividing it into measuring and reference beams, a detector and a focusing device. The measuring beam at least partly reflected by the object and the reference beam are superimposed on a detection area of the detector, and the focusing device in the beam path of the measuring beam between the image unit and object focuses it onto a measuring point. Here, a measuring beam having a wavelength greater than 1100 nm is generated and the device has an image unit for two-dimensional imaging of the object surrounding the measuring point. The measuring beam focus lies in the focal plane of the image unit and, by use of the focusing device, the focal point of the measuring beam and the focal plane of the imaging unit are displaceable simultaneously.