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Tomoyu Yamashita

This inventor holds 13 USPTO granted patents and 1 published patent application. Top assignee: Adv Antest Corporation. Active years: 2002-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomoyu Yamashita. Retrieved from https://idiyas.com/inventor/tomoyu-yamashita

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 13 (Patent Applications = 1)

% Patents Active = 46.2

Average Co-Inventor Count = 2.3

ph-index = 3

Forward Citations = 19(Granted Patents)

Location History:

Saitama, JP (2002 - 2010)
Miyagi, JP (2012 - 2017)

Company Filing History:

13 out of 2,283

Adv Antest Corporation

Years Active: 2002-2017

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9568422 - Light beam incident device and reflected light measurement device (2017-02-14),

2. 9190804 - Pulse light source, and method for stably controlling phase difference between pulse laser lights (2015-11-17),

3. 9176008 - Electromagnetic wave measuring apparatus, measuring method, program, and recording medium (2015-11-03),

4. 8718108 - Repetition frequency control device (2014-05-06),

5. 8676061 - Signal output device, and output apparatus of signal source of signals and of laser beam pulses (2014-03-18),

6. 8493057 - Electromagnetic wave measuring apparatus, measuring method, program, and recording medium (2013-07-23),

7. 8481938 - Electromagnetic wave measuring apparatus, measuring method, program, and recording medium (2013-07-09),

8. 8306078 - Repetition frequency control device (2012-11-06),

9. 8279438 - Optical measuring apparatus (2012-10-02),

10. 8183528 - Electromagnetic wave measuring apparatus, measurement method, a program, and a recording medium (2012-05-22),

11. 7697122 - Measuring device, method, program, and recording medium (2010-04-13),

12. 7006207 - Polarization mode dispersion measuring device, method, recording medium (2006-02-28),

13. 6426792 - Optical characteristic measuring apparatus, the method thereof and recording medium (2002-07-30),

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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