The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Mar. 25, 2010
Shigeki Nishina, Miyagi, JP;
Motoki Imamura, Miyagi, JP;
Akiyoshi Irisawa, Miyagi, JP;
Tomoyu Yamashita, Miyagi, JP;
Eiji Kato, Miyagi, JP;
Shigeki Nishina, Miyagi, JP;
Motoki Imamura, Miyagi, JP;
Akiyoshi Irisawa, Miyagi, JP;
Tomoyu Yamashita, Miyagi, JP;
Eiji Kato, Miyagi, JP;
Advantest Corporation, Tokyo, JP;
Abstract
According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test and a container storing at least a part of the device under test.