The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Oct. 09, 2002
Takeshi Ozeki, Saitama, JP;
Tomoyu Yamashita, Saitama, JP;
Motoki Imamura, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A device for measuring τincludes a polarization controller () that allows first (second) incident light, in a synthetic incident light to an object to be measured (), to be in line with a p-polarization (s-polarization) axis in a polarization separator (). The phase shift equivalent value (optical angle frequency differentiation) and amplitude equivalent value (square value) of a first (second) incident light component in an output from the polarization separator () measured by a first (second) measuring unit () are respectively the phase shift equivalent value and amplitude equivalent value of a first column T, T(second column T, T) when the transfer function matrix of the object () is a 2×2 matrix to thereby allow a control unit () to determine the polarization mode dispersion τof the object ().