The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Sep. 04, 2006
Tomoyu Yamashita, Saitama, JP;
Eiji Kato, Gunma, JP;
Tomoyu Yamashita, Saitama, JP;
Eiji Kato, Gunma, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A frequency resolution for measuring transmission characteristics of a device under test is increased. With a measuring device including a first terahertz light generator that generates incident light, a second terahertz light generator that generates reference light having an optical frequency f−f−fdifferent from an optical frequency f−fof the incident light by a constant difference frequency f, a terahertz light detector which outputs an light detection signal having the difference frequency fbased on response light obtained by making the incident light incident to an optical fiber and the reference light, and a network analyzer that receives the light detection signal, thereby measuring characteristics of the optical fiber, a spectrum of the incident light (terahertz light) incident to the optical fiber includes the carrier frequency (f−f), but does not include sideband frequencies (f−f±f). It is thus possible to reduce the effective spectrum width of the incident light. As a result, the frequency resolution increases in the measurement of the transmission characteristics of the optical fiber.