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Taketo Ueno

This inventor holds 22 USPTO granted patents. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi High-Tech Electronics Engineering Co., Ltd.. Active years: 2005-2019.

USPTO Granted Patents = 22

% Patents Active = 68.2

Average Co-Inventor Count = 4.0

ph-index = 4

Forward Citations = 69(Granted Patents)

Location History:

Fujisawa, JP (2005 - 2014)
Kawasaki, JP (2010 - 2017)
Tokyo, JP (2015 - 2019)

Company Filing History:

20 out of 2,874

Hitachi-High-Technologies Corporation

Hitachi High-Tech Electronics Engineering Co., Ltd.

patents

4. 1 out of 1,351

The University of Tokyo

patents

where one patent can have more than one assignee

Years Active: 2005-2019

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22 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10228332 - Defect inspection device and defect inspection method (2019-03-12),

2. 9683946 - Method and device for detecting defects and method and device for observing defects (2017-06-20),

3. 9588055 - Defect inspection apparatus and defect inspection method (2017-03-07),

4. 9535013 - Method and apparatus for inspecting defect (2017-01-03),

5. 9255793 - Defect inspection method and device thereof (2016-02-09),

6. 9182592 - Optical filtering device, defect inspection method and apparatus therefor (2015-11-10),

7. 9019492 - Defect inspection device and defect inspection method (2015-04-28),

8. 8970836 - Defect inspecting apparatus and defect inspecting method (2015-03-03),

9. 8885037 - Defect inspection method and apparatus therefor (2014-11-11),

10. 8830465 - Defect inspecting apparatus and defect inspecting method (2014-09-09),

11. 8804112 - Method of defect inspection and device of defect inspection (2014-08-12),

12. 8681328 - Dark-field defect inspecting method, dark-field defect inspecting apparatus, aberration analyzing method, and aberration analyzing apparatus (2014-03-25),

13. 8660336 - Defect inspection system (2014-02-25),

14. 8289507 - Method of apparatus for detecting particles on a specimen (2012-10-16),

15. 8275189 - Defect inspection system (2012-09-25),

Title: Taketo Ueno: Pioneering Inventor from Fujisawa

Introduction: Taketo Ueno is a distinguished inventor hailing from Fujisawa, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Taketo Ueno's recent patents include advancements in artificial intelligence algorithms for autonomous vehicles and cutting-edge medical devices for non-invasive diagnostics.

Career Highlights: With over two decades of experience in research and development, Taketo Ueno has led numerous projects that have resulted in patented inventions that have revolutionized various industries.

Collaborations: Throughout his career, Taketo Ueno has collaborated with leading technology companies, research institutions, and universities to bring his innovative ideas to life and create tangible solutions for complex challenges.

Conclusion: Taketo Ueno's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

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