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For the Inventor, By the Inventor

Fujisawa, Japan

Takashi Kawahito

This inventor holds 13 USPTO granted patents. Top assignees: Nikon Corporation, Nara Institute of Science and Technology. Active years: 1996-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takashi Kawahito. Retrieved from https://idiyas.com/inventor/takashi-kawahito

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 13

% Patents Active = 76.9

Average Co-Inventor Count = 1.4

ph-index = 5

Forward Citations = 70(Granted Patents)


Location History:

  • Fujsawa, JP (1998 - 2011)
  • Fujisawa, JP (1996 - 2016)
  • Tokyo, JP (2019)

Company Filing History:

goldMedal13 out of 8,997 
 
Nikon Corporation
 patents
silverMedal1 out of 114 
 
Nara Institute of Science and Technology
 patents
where one patent can have more than one assignee

Years Active: 1996-2019

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13 patents (USPTO):Explore Patents
1. 10241314 - Microscope apparatus and storage medium storing microscope apparatus control program (2019-03-26),
2. 9261699 - Microscope apparatus and storage medium storing microscope apparatus control program (2016-02-16),
3. 8284481 - Objective lens, nosepiece and inverted microscope equipped therewith (2012-10-09),
4. 8066962 - Environment holding apparatus and environment control type analyzer (2011-11-29),
5. 7957058 - Microscope (2011-06-07),
6. 7843634 - Automatic focus detection device and microscope system having the same (2010-11-30),
7. 7742227 - Microscope apparatus (2010-06-22),
8. 6404546 - Inverted microscope (2002-06-11),
9. 6313944 - Microscope turret assembly and a microscope (2001-11-06),
10. 6268959 - Inverted microscope with objective lens view opening and method for using same (2001-07-31),
11. 6239905 - Inverted microscope (2001-05-29),
12. 5723793 - Methods and apparatus for measuring stress and strain characteristics of (1998-03-03),
13. 5572359 - Differential interference microscope apparatus and an observing method (1996-11-05),

Title: The Innovative Contributions of Takashi Kawahito

Introduction

Takashi Kawahito is a prominent inventor based in Fujisawa, Japan. He has made significant contributions to the field of microscopy, holding a total of 13 patents. His work focuses on enhancing the functionality and accuracy of microscope apparatuses, which are essential tools in various scientific and medical applications.

Latest Patents

One of Kawahito's latest patents involves a microscope apparatus that includes a monitoring optical system and an imaging unit. This system captures images of an observation target, generating multiple images for analysis. A correction unit is integrated into the optical monitoring system to address various aberrations that may occur due to different observation conditions. Additionally, a decision unit determines the necessary correction amount based on the generated images, ensuring that any image deterioration caused by aberrations is effectively corrected according to the microscope's usage conditions.

Career Highlights

Throughout his career, Takashi Kawahito has worked with notable organizations such as Nikon Corporation and the Nara Institute of Science and Technology. His experience in these esteemed institutions has allowed him to refine his skills and contribute to advancements in optical technology.

Collaborations

Kawahito has collaborated with several talented individuals in his field, including Shuji Toyoda and Yumiko Ouchi. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in microscopy.

Conclusion

Takashi Kawahito's contributions to the field of microscopy through his patents and collaborations highlight his role as a key innovator. His work continues to influence the development of advanced optical systems, making significant strides in scientific research and applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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