The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2001

Filed:

Mar. 09, 1998
Applicant:
Inventor:

Takashi Kawahito, Fujisawa, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/100 ; G02B 2/106 ;
U.S. Cl.
CPC ...
G02B 2/100 ; G02B 2/106 ;
Abstract

A microscope turret assembly and a microscope with the turret assembly are provided so that active use is made of the space formed on an underside surface of a turret by providing an illuminator or an optical detector therein. The turret retains multiple objective lenses and, by rotation thereof, enables the selection of a single objective lens. At least a part of an illuminator that casts light on an observed specimen via the selected objective lens, or a part of an optical detector that detects light from an observed specimen, is located in the space.


Find Patent Forward Citations

Kawahito, Takashi. (2001). Microscope turret assembly and a microscope (U.S. Patent No. 6313944). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6313944

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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