Nikon Corporation

Nara Institute of Science and Technology

Takashi Kawahito

Yumiko Ouchi

Shuji Toyoda

Yoshihiko Suzuki

Tatsuro Otaki

Kumiko Matsui

Tadao Sugiura

Katsuhiko Yasaka

A microscope apparatus includes a monitoring optical system, an imaging unit capturing an image of an observation target through the monitoring optical system to generate a plurality of images, a correction unit disposed in the optical monitoring system and correcting various aberrations which occur due to an observation condition, and a decision unit deciding a correction amount of the correction unit based on the plurality of images generated by the imaging unit, whereby an image deterioration ascribable to the aberration occurring due to the observation condition in the microscope apparatus is appropriately and easily corrected according to a use condition of the microscope apparatus.

Microscope apparatus and storage medium storing microscope apparatus control program

An objective lens to be fitted into a fitting hole of a nosepiece of a microscope includes an imaging lens that is composed of a plurality of lens groups, and a lens barrel that holds the imaging lens. The lens barrel is formed with a fitting portion that is fitted to the fitting hole of the nosepiece and provided at an outer circumference of a tip portion side away by a given distance from the tip portion where a first lens group in the imaging lens is held, and a mount surface that comes into contact with a contact surface of the fitting hole of the nosepiece upon fitting at the fitting portion. The nosepiece is equipped with the objective lens. The inverted microscope is equipped with the nosepiece fitting the objective lens.

Objective lens, nosepiece and inverted microscope equipped therewith

An environment holding apparatus includes: a first chamber that has an opening and holds a sample; a moving stage that is two-dimensionally moved with the first chamber being mounted thereon; and a first plane that includes an introduction port having a function of introducing gas adjusted to predetermined conditions into the first chamber from a pipe, and that is provided so as to cover the opening of the first chamber. The first plane is provided so as to be kept stationary regardless of a movement of the moving stage and the opening of the first chamber is two-dimensionally moved along the first plane by the movement of the moving stage.

Environment holding apparatus and environment control type analyzer

A microscope for introducing light from a light source via an objective lens to a sample so that a user observes the sample via the objective lens includes: a minute opening arranged in an optical path between the light source and the objective lens and on a focal plane of the image side of the objective lens or at a position conjugate with its conjugate plane; position adjusting means for adjusting the position of the minute opening so that the light from the light source via the minute opening is incident to the sample at the Brewster's angle; an polarizing element arranged in the optical path between the light source and the objective lens for extracting rectilinear polarized light from the light from the light source and applying the rectilinear polarized light to the sample.

Microscope

An AF dark field illumination device and an objective lens are moved in unity. A tissue sample in a Petri dish is illuminated by infrared light incident with an oblique angle from an LED light source. The casting of the infrared light causes scattered light from the tissue sample. A part of the scattered light passes through the objective lens, thereby forming a dark-field microscope image, which is captured by a CCD camera. The sharpness of the dark-field microscope image is dependent upon the position of the objective lens. The position of the objective lens at which the dark-field microscopic image exhibits the highest sharpness is determined to be the focus position.

Automatic focus detection device and microscope system having the same

Providing a microscope apparatus including an optical mount member capable of supporting various optical devices even without a large amount of space. A base bodyarranged on a mount surfaceof a vibration isolation tableis provided substantially perpendicularly to the mount surface. A plurality of railsthroughare provided on the base bodyvertically to the mount surfaceso as to provide a plurality of extension optical devices such as a Galvanic scannerto be combined with the microscope main body

Microscope apparatus

An inverted microscope has a microscope base, a stage, an observation optical system, a stage support structure which is arranged on the microscope base and supports the stage, and a switching structure having a plurality of objective lenses and capable of inserting one of the objective lenses into an optical path of the observation optical system selectively. A support structure is fixed to a lower surface of the stage and supports the switching structure for movement in an optical axis direction of the objective lens inserted in the optical path of the observation optical system.

Inverted microscope

A microscope turret assembly and a microscope with the turret assembly are provided so that active use is made of the space formed on an underside surface of a turret by providing an illuminator or an optical detector therein. The turret retains multiple objective lenses and, by rotation thereof, enables the selection of a single objective lens. At least a part of an illuminator that casts light on an observed specimen via the selected objective lens, or a part of an optical detector that detects light from an observed specimen, is located in the space.

Microscope turret assembly and a microscope

An inverted microscope capable of confirming a marking or the like on an objective lens arranged under a stage from a normal viewpoint near an eyepiece without having to take a forced posture. The inverted microscope has a main body, a stage on the main body which holds a sample container, a nosepiece arranged under the stage, an objective lens fitted on the nosepiece, an eyepiece located diagonally above the stage, and an illumination system held over the stage by an illumination column. The stage has a confirmation opening, which is used for confirming conditions under the stage, and an observation opening, which is used to observe the sample. The confirmation opening is formed closer to the observer side of the optical axis of the objective lens than the observation opening, and is formed separately from the observation opening. The confirmation opening secures an optical path to view and observe the objective lens from a normal viewpoint near the eyepiece. Thus, a marking on the objective lens, as well as conditions around the objective lens can be confirmed from a normal viewpoint through the confirmation opening while a sample container is on the observation opening.

Inverted microscope with objective lens view opening and method for using same

An inverted microscope has a microscope base, a stage, an observation optical system having an objective lens, a stage support member which is arranged on the microscope base and supports the stage at two ends, and a change member which can change the level position of the stage with respect to the microscope base.

Methods and apparatus are disclosed for measuring stress and strain of microscopic specimens under a microscope. The measurements of strain can be performed simultaneously with measurement of the stress, thereby avoiding problems with creep. The apparatus and methods employ an electrically driven microgripper having at least one finger adapted to contact the specimen. The apparatus and methods also employ a device operable to measure the dimensional change (strain) experienced by the specimen upon application of a stress to the specimen using the finger(s) of the microgripper. From measurements of electrical energy supplied to the microgripper before and during application of the stress to the specimen, and of the stress-caused dimensional change of the specimen, stress-versus-strain information about the specimen can be calculated.

Methods and apparatus for measuring stress and strain characteristics of

A differential interference microscope which includes a light source, a condenser optical system for condensing beams of light from the light source and illuminating an object with the beams of light, an objective optical system for converging the beams of light from the illuminated object and forming an image of the object, a pick-up device for photoelectrically detecting the image of the object, and a contrast enhancement circuit for enhancing a contrast of the image on the basis of an output signal of the pick-up device. A first polarizing element and a first birefringent element are disposed sequentially in an optical path between the light source and the object. The first polarizing element changes the beams of light from the light source into predetermined beams of polarized light. The first birefringent element separates the polarized light into an ordinary ray and an extraordinary ray. A second birefringent element and a second polarizing element are disposed sequentially in an optical path between the object and the image. The second birefringent element guides the two light beams from the object onto the same optical path. The second polarizing element causes the two light beams guided onto the same optical path to interfere with each other. The shear quantity S between the ordinary ray and the extraordinary ray satisfies the following condition:

Growing community of inventors

Fujisawa, Japan

Takashi Kawahito