The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2012

Filed:

Dec. 11, 2009
Applicant:

Takashi Kawahito, Fujisawa, JP;

Inventor:

Takashi Kawahito, Fujisawa, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An objective lens to be fitted into a fitting hole of a nosepiece of a microscope includes an imaging lens that is composed of a plurality of lens groups, and a lens barrel that holds the imaging lens. The lens barrel is formed with a fitting portion that is fitted to the fitting hole of the nosepiece and provided at an outer circumference of a tip portion side away by a given distance from the tip portion where a first lens group in the imaging lens is held, and a mount surface that comes into contact with a contact surface of the fitting hole of the nosepiece upon fitting at the fitting portion. The nosepiece is equipped with the objective lens. The inverted microscope is equipped with the nosepiece fitting the objective lens.


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