The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Aug. 19, 2005
Applicant:

Takashi Kawahito, Fujisawa, JP;

Inventor:

Takashi Kawahito, Fujisawa, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An AF dark field illumination device and an objective lens are moved in unity. A tissue sample in a Petri dish is illuminated by infrared light incident with an oblique angle from an LED light source. The casting of the infrared light causes scattered light from the tissue sample. A part of the scattered light passes through the objective lens, thereby forming a dark-field microscope image, which is captured by a CCD camera. The sharpness of the dark-field microscope image is dependent upon the position of the objective lens. The position of the objective lens at which the dark-field microscopic image exhibits the highest sharpness is determined to be the focus position.


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