The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2002
Filed:
Apr. 09, 2001
Applicant:
Inventors:
Shuji Toyoda, Chigasaki, JP;
Takashi Kawahito, Fujisawa, JP;
Assignee:
Nikon Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/126 ; G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/126 ; G02B 2/100 ;
Abstract
An inverted microscope has a microscope base, a stage, an observation optical system, a stage support structure which is arranged on the microscope base and supports the stage, and a switching structure having a plurality of objective lenses and capable of inserting one of the objective lenses into an optical path of the observation optical system selectively. A support structure is fixed to a lower surface of the stage and supports the switching structure for movement in an optical axis direction of the objective lens inserted in the optical path of the observation optical system.