The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2001

Filed:

Aug. 14, 2000
Applicant:
Inventor:

Takashi Kawahito, Fujisawa, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/126 ; G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/126 ; G02B 2/100 ;
Abstract

An inverted microscope capable of confirming a marking or the like on an objective lens arranged under a stage from a normal viewpoint near an eyepiece without having to take a forced posture. The inverted microscope has a main body, a stage on the main body which holds a sample container, a nosepiece arranged under the stage, an objective lens fitted on the nosepiece, an eyepiece located diagonally above the stage, and an illumination system held over the stage by an illumination column. The stage has a confirmation opening, which is used for confirming conditions under the stage, and an observation opening, which is used to observe the sample. The confirmation opening is formed closer to the observer side of the optical axis of the objective lens than the observation opening, and is formed separately from the observation opening. The confirmation opening secures an optical path to view and observe the objective lens from a normal viewpoint near the eyepiece. Thus, a marking on the objective lens, as well as conditions around the objective lens can be confirmed from a normal viewpoint through the confirmation opening while a sample container is on the observation opening.


Find Patent Forward Citations

Kawahito, Takashi. (2001). Inverted microscope with objective lens view opening and method for using same (U.S. Patent No. 6268959). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6268959

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…