IDiyas

For the Inventor, By the Inventor

Waalre, Netherlands

Seyed Iman Mossavat

USPTO Granted Patents = 12 

Average Co-Inventor Count = 3.1

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Veldhoven, NL (2017)
  • Eindhoven, NL (2018)
  • Waalre, NL (2018 - 2023)

Company Filing History:

goldMedal12 out of 4,883 
 
Asml Netherlands B.v.
 patents

Years Active: 2017-2025

Loading Chart...
12 patents (USPTO):
1. 12204298 - Methods of modelling systems for performing predictive maintenance of systems, such as lithographic systems (2025-01-21),
2. 11556060 - Method of calibrating a plurality of metrology apparatuses, method of determining a parameter of interest, and metrology apparatus (2023-01-17),
3. 11392043 - Method and metrology apparatus for determining estimated scattered radiation intensity (2022-07-19),
4. 10996568 - Methods and apparatus for metrology (2021-05-04),
5. 10901323 - Metrology method and apparatus with increased bandwidth (2021-01-26),
6. 10732514 - Metrology method and apparatus with increased bandwidth (2020-08-04),
7. 10627213 - Statistical hierarchical reconstruction from metrology data (2020-04-21),
8. 10429746 - Estimation of data in metrology (2019-10-01),
9. 10369752 - Metrology method and apparatus, computer program and lithographic system (2019-08-06),
10. 10156797 - Method of determining edge placement error, inspection apparatus, patterning device, substrate and device manufacturing method (2018-12-18),
11. 10151985 - Process flagging and cluster detection without requiring reconstruction (2018-12-11),
12. 9760018 - Method and inspection apparatus and computer program product for assessing a quality of reconstruction of a value of a parameter of interest of a structure (2017-09-12),

Sure, let's start with the article:

**Title: Unveiling the Innovations of Seyed Iman Mossavat**

Introduction

Seyed Iman Mossavat, a prominent inventor hailing from Waalre, NL, has made significant strides in the field of metrology with a remarkable collection of 11 patents to his name. Known for his cutting-edge solutions, Mossavat has revolutionized the calibration and parameter determination processes in metrology apparatuses.

Latest Patents

Mossavat's latest patents showcase his prowess in the realm of metrology. One such patent involves a method for calibrating a plurality of metrology apparatuses and determining parameters of interest. By utilizing machine learning processes and synthetic representations, Mossavat's invention enhances the accuracy and efficiency of metrology systems. Another patent focuses on determining the estimated scattered radiation intensity, employing advanced techniques to calculate radiation scattered by a target illuminated by a radiation source.

Career Highlights

Seyed Iman Mossavat is associated with ASML Netherlands B.V., a leading company in the field of advanced technology solutions. His tenure at ASML Netherlands B.V. has been marked by groundbreaking innovations and technological advancements that have reshaped the landscape of metrology.

Collaborations

Throughout his career, Mossavat has collaborated with esteemed professionals in the industry, including Hugo Augustinus Joseph Cramer and Remco Dirks. Together, they have contributed to the development of cutting-edge solutions in metrology and have set new benchmarks for precision and accuracy in the field.

Conclusion

In conclusion, Seyed Iman Mossavat's innovative spirit and dedication to excellence have established him as a trailblazer in the field of metrology. His patents not only reflect his technical acumen but also signify his commitment to pushing the boundaries of innovation. Mossavat's contributions continue to inspire and drive advancements in metrology, promising a future filled with revolutionary discoveries.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…