The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Feb. 04, 2021
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Carlo Lancia, Eindhoven, NL;

Anjan Prasad Gantapara, Veldhoven, NL;

Dirk-Jan Kernkamp, 's-Hertogenbosch, NL;

Seyed Iman Mossavat, Waalre, NL;

Alexander Ypma, Veldhoven, NL;

Assignee:

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01);
U.S. Cl.
CPC ...
G05B 13/048 (2013.01); G05B 13/042 (2013.01);
Abstract

A method of tuning a prediction model relating to at least one particular configuration of a manufacturing device. The method includes obtaining a function including at least a first function of first prediction model parameters associated with the at least one particular configuration, and a second function of the first prediction model parameters and second prediction model parameters associated with configurations of the manufacturing device and/or related devices other than the at least one particular configuration. Values of the first prediction model parameters are obtained based on an optimization of the function, and a prediction model is tuned according to these values of the first prediction model parameters to obtain a tuned prediction mode.


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