The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Aug. 13, 2019
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Seyed Iman Mossavat, Waalre, NL;

Remco Dirks, Deurne, NL;

Hendrik Jan Hidde Smilde, Veldhoven, NL;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G01N 23/20066 (2018.01); G01N 23/201 (2018.01);
U.S. Cl.
CPC ...
G03F 7/70625 (2013.01); G01N 23/201 (2013.01); G01N 23/20066 (2013.01); G03F 7/705 (2013.01); G03F 7/70633 (2013.01);
Abstract

A method of determining an estimated intensity of radiation scattered by a target illuminated by a radiation source, has the following steps: obtaining and training () a library REFLIB of wavelength-dependent reflectivity as a function of the wavelength, target structural parameters and angle of incidence R(λ,θ,x,y); determining () a wide-band library (W-BLIB) of integrals of wavelength-dependent reflectivity R of the target in a Jones framework over a range of radiation source wavelengths λ; training (TRN) () the wide-band library; and determining (), using the trained wide-band library, an estimated intensity (INT) of radiation scattered by the target illuminated by the radiation source.


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