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Veldhoven, Netherlands

Hendrik Jan Hidde Smilde

USPTO Granted Patents = 38 

Average Co-Inventor Count = 4.2

ph-index = 8

Forward Citations = 343(Granted Patents)


Company Filing History:

goldMedal38 out of 4,883 
 
Asml Netherlands B.v.
 patents

Years Active: 2012-2025

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38 patents (USPTO):
1. 12429328 - Metrology method, target and substrate (2025-09-30),
2. 11526085 - Metrology method and apparatus, substrate, lithographic system and device manufacturing method (2022-12-13),
3. 11428521 - Metrology method, target and substrate (2022-08-30),
4. 11392043 - Method and metrology apparatus for determining estimated scattered radiation intensity (2022-07-19),
5. 11204239 - Metrology method, target and substrate (2021-12-21),
6. 11181828 - Method of determining a value of a parameter of interest of a patterning process, device manufacturing method (2021-11-23),
7. 11092900 - Method and apparatus for measuring a parameter of a lithographic process, substrate and patterning devices for use in the method (2021-08-17),
8. 10739687 - Metrology method and apparatus, substrate, lithographic system and device manufacturing method (2020-08-11),
9. 10725386 - Metrology method and apparatus, lithographic system and device manufacturing method (2020-07-28),
10. 10718604 - Metrology method, target and substrate (2020-07-21),
11. 10481503 - Method and apparatus for measuring a parameter of a lithographic process, substrate and patterning devices for use in the method (2019-11-19),
12. 10386176 - Metrology method, target and substrate (2019-08-20),
13. 10331043 - Optimization of target arrangement and associated target (2019-06-25),
14. 10331041 - Metrology method and apparatus, lithographic system and device manufacturing method (2019-06-25),
15. 10162272 - Metrology method and apparatus, substrates for use in such methods, lithographic system and device manufacturing method (2018-12-25),

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Title: The Innovative Journey of Hendrik Jan Hidde Smilde

Introduction:

Hendrik Jan Hidde Smilde, a visionary inventor hailing from Veldhoven, NL, is celebrated for his unwavering commitment to innovation. With an impressive portfolio of 37 patents to his name, Smilde has undoubtedly left an indelible mark on the world of technology. His inventive spirit serves as a beacon for aspiring inventors and innovators globally.

Latest Patents:

Among his latest patents is a groundbreaking metrology method and apparatus, substrate, lithographic system, and device manufacturing method. This innovative approach involves utilizing a small target in dark-field metrology, where image characteristics are determined through a sophisticated combination fit function. Incorporating jinc functions to represent the point spread function, Smilde's method showcases his prowess in pushing the boundaries of technological advancements.

Career Highlights:

Currently associated with ASML Netherlands B.V., a renowned technology company, Hendrik Jan Hidde Smilde continues to drive innovation in the field. His exceptional contributions have positioned him as a key figure in the world of technological advancements, with each patent adding a unique dimension to his illustrious career.

Collaborations:

Smilde's innovative journey is complemented by his collaborations with talented individuals such as Maurits Van Der Schaar and Michael Kubis. Together, they have spearheaded projects that have redefined technological norms and paved the way for groundbreaking inventions.

Conclusion:

In conclusion, Hendrik Jan Hidde Smilde's relentless pursuit of innovation and his remarkable contributions underscore his status as a true pioneer in the field of technology. His inventive legacy serves as a source of inspiration for future generations, propelling the world of innovation towards new horizons.

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