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For the Inventor, By the Inventor

Delmar, NY, United States of America

Sergey Alexandrovich Voronin

This inventor holds 44 USPTO granted patents and 15 published patent applications and 7 EPO patents, primarily in Plasma Etching Techniques. Top assignees: Tokyo Electron Limited, Edwards Limited. Active years: 2015-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sergey Alexandrovich Voronin. Retrieved from https://idiyas.com/inventor/sergey-alexandrovich-voronin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 44 

% Patents Active = 95.5

 

Average Co-Inventor Count = 3.2

ph-index = 3

Forward Citations = 80(Granted Patents)


Location History:

  • Rensselaer, NY (US) (2015 - 2018)
  • Delmar, NY (US) (2016 - 2020)
  • Glenmont, NY (US) (2018 - 2020)
  • Albany, NY (US) (2020 - 2024)

Company Filing History:

goldMedal38 out of 10,933 
 
Tokyo Electron Limited
 patents
silverMedal6 out of 287 
 
Edwards Limited
 patents

Years Active: 2015-2026

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Areas of Expertise:
Selective Etching
Plasma Processing
Optical Emission Spectroscopy
Ion Mass Segregation
Photoresists Development
Silicon Etching
Reactive Ion Etching
Gas Treatment
Surface Wave Plasma
Wafer Clamping
Nitride Layers
ReRAM Stabilization
44 patents (USPTO):Explore Patents
1. 12749664 - Advanced OES characterization (2026-09-29),
2. 12730085 - Apparatus and method for plasma measurement (2026-09-08),
3. 12719025 - Methods for semiconductor process chamber (2026-08-25),
4. 12712152 - SYSTEM AND METHOD FOR PLASMA PROCESSING (2026-08-18),
5. 12628594 - Method for selective etching by local photon surface activation (2026-05-12),
6. 12525437 - Substrate bombardment with ions having targeted mass using pulsed bias phase control (2026-01-13),
7. 12506112 - Method for etching of metal (2025-12-23),
8. 12362158 - Method for OES data collection and endpoint detection (2025-07-15),
9. 12306044 - Optical emission spectroscopy for advanced process characterization (2025-05-20),
10. 12287578 - Cyclic method for reactive development of photoresists (2025-04-29),
11. 12158374 - Time-resolved OES data collection (2024-12-03),
12. 12009430 - Method for gate stack formation and etching (2024-06-11),
13. 12002683 - Lateral etching of silicon (2024-06-04),
14. 11699741 - Metal-containing liner process (2023-07-11),
15. 11651970 - Systems and methods for selective ion mass segregation in pulsed plasma atomic layer etching (2023-05-16),

Title: Sergey Alexandrovich Voronin: Pioneering Inventor from Delmar, NY

Introduction: Sergey Alexandrovich Voronin is a distinguished inventor hailing from Delmar, NY, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Sergey Alexandrovich Voronin holds several patents in the areas of artificial intelligence, renewable energy, and biotechnology, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Voronin has worked with leading tech companies and research institutions, spearheading projects that have revolutionized various industries. His innovative solutions have earned him recognition as a visionary in the field of invention.

Collaborations: Throughout his career, Sergey Alexandrovich Voronin has collaborated with top scientists, engineers, and researchers from around the world, fostering a culture of innovation and knowledge-sharing. His collaborative efforts have led to the development of cutting-edge technologies with real-world applications.

Conclusion: Sergey Alexandrovich Voronin's passion for innovation and his relentless pursuit of excellence have solidified his position as a trailblazer in the world of invention. His work continues to inspire future generations of inventors to push the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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