Location History:
- Kitakyushu, JP (2011)
- Iizuka, JP (2013 - 2016)
- Fukuoka, JP (2004 - 2017)
Company Filing History:
10 out of 151 
7 out of 1,311 
5 out of 6 
Years Active: 2004-2017
Title: Seiji Kajihara: Innovator in Test Pattern Generation and Fault Detection Systems
Introduction
Seiji Kajihara is a prominent inventor based in Fukuoka, Japan. He has made significant contributions to the fields of test pattern generation and fault detection systems. With a total of 18 patents to his name, Kajihara's work has had a substantial impact on the technology sector.
Latest Patents
Kajihara's latest patents include a test pattern generation device, a fault detection system, and a test pattern generation method. The test pattern generation device is designed to create new test patterns while preserving the features of original test patterns. It incorporates a logic value generation unit that generates a new logic value by referencing given logic values of multiple bits. This innovative device ensures that the logic values of the first, second, and third bits are aligned with the original or newly generated test patterns.
The fault detection system aims to reduce shift power during scan-out while maintaining fault coverage. It is configured to detect faults in logic circuits through a scan test. This system includes multiple flip-flops, a final signal generation unit, and an assignment unit that sets logic signals for some flip-flops based on the final signal. The fault detection device then compares test outputs to identify any faults present in the logic circuit.
Career Highlights
Kajihara has worked with notable institutions such as the Kyushu Institute of Technology and the Japan Science and Technology Agency. His experience in these organizations has allowed him to develop and refine his innovative technologies.
Collaborations
Throughout his career, Kajihara has collaborated with esteemed colleagues, including Xiaoqing Wen and Kohei Miyase. These partnerships have contributed to the advancement of his research and inventions.
Conclusion
Seiji Kajihara's contributions to test pattern generation and fault detection systems highlight his role as a leading inventor in the technology field. His innovative patents and collaborations reflect his commitment to advancing technology and improving fault detection methodologies.