Diagnostic device, diagnostic method, program, and recording medium

Abstract

Provided are a diagnostic device and the like providing a favorable diagnosis result by further improving the diagnosis resolution. A diagnostic devicehas a symbol injection part, which is composed of a symbol injection part for an active elementand a symbol injection part for a passive element, an occurrence probability providing part, an equal occurrence probability providing part, and a switching part. A per-test X-fault diagnosis flow by the diagnostic deviceconsists of a stage for collecting diagnostic information and a stage for drawing diagnostic conclusion. The layout of a deep-submicron LSI circuit usually needs to involve multiple layers, which means that vias are extensively used. Since via information is utilized by the symbol injection part for a passive element, it becomes possible to locate defects to the via level, greatly improving the diagnostic resolution. Since, by the occurrence probability providing part, a new diagnosis value is used and, the occurrence probabilities of possible faulty logic combinations are taken into consideration, the reality in a deep-submicron LSI circuit is better reflected, which contributes to the improvement of diagnostic resolution.