Xiaoqing Wen

Title: **Xiaoqing Wen: Innovator in Scan-Based Integrated Circuits**

Introduction

Xiaoqing Wen, located in Sunnyvale, CA, has made significant contributions to the field of integrated circuits through his inventive expertise. With a remarkable portfolio of 43 patents, Wen stands out as a prolific inventor in his domain, particularly in developing methods to enhance testing and fault detection in scan-based integrated circuits.

Latest Patents

Xiaoqing Wen's latest patents focus on innovative methods and apparatuses for improving the efficiency of test data application in integrated circuits. One of his groundbreaking patents is a method for broadcasting scan patterns in a scan-based integrated circuit. This invention introduces a broadcaster, system, and method that reduces test data volume and test application time in automatic test equipment (ATE). The design features multiple scan chains, each with multiple series-coupled scan cells. The broadcaster operates in conjunction with a virtual scan controller, allowing for the generation of broadcast scan patterns to effectively test manufacturing faults within the integrated circuit.

Another significant patent is the multiple-capture Design for Testability (DFT) method, which aims to detect or locate clock-domain crossing faults. This method provides ordered capture clocks to ensure that fault detection is efficient across N clock domains during self-test or scan-test modes. It outlines a structured approach to applying capture clocks sequentially, ensuring that not all clock domains are triggered simultaneously, thus enhancing the reliability of fault analysis in integrated circuits.

Career Highlights

Throughout his career, Xiaoqing Wen has worked with reputable organizations, including Syntest Technologies, Inc. and Kyushu Institute of Technology. His work in these companies has allowed him to refine his skills and push the boundaries of innovation in integrated circuit testing methods.

Collaborations

Wen has collaborated with notable experts in the field, including Laung-Terng Wang and Po-Ching Hsu. These collaborations have contributed to his growing body of work and have facilitated advancements in the methodologies associated with integrated circuit testing.

Conclusion

Xiaoqing Wen's dedication to innovation in the area of scan-based integrated circuits is evident through his extensive patent portfolio and collaborative efforts. His inventions not only enhance the efficiency of testing methods but also play a critical role in the development of reliable integrated circuit technologies, marking him as a key figure in the evolution of this field.