Generating device, generating method, program and recording medium

Abstract

Provided are a generation device and the like for generating a test vector which can reduce capture power efficiently. The generation devicegenerates a test vector for a logic circuit by assigning logic values to each of a plurality of unspecified bits (X-bits) included in a test cube. The generation deviceincludes a selection unitfor selecting, among the plurality of X-bits, a target X-bit, which is a target of assigning a logic value, a capture transition metric calculation unitfor calculating capture transition metric caused by a test cube including an X-bit, and a logic value assignment unitfor assigning, to the selected target X-bit, a logic value which causes the smaller capture transition metric, by applying the capture transition metric calculation means to a first test cube obtained by assigning a logic value 0 to the selected target X-bit and to a second test cube obtained by assigning a logic value 1 to the selected target X-bit, and by comparing a capture transition metric caused by a first test cube and a capture transition metric caused by a second test cube.