Hiroshi Date

Title: Hiroshi Date: Innovator in Fault Diagnosis Systems

Introduction

Hiroshi Date is a prominent inventor based in Fukuoka, Japan. He has made significant contributions to the field of fault diagnosis systems, holding a total of seven patents. His innovative work focuses on enhancing the reliability and efficiency of photovoltaic modules and logic circuits.

Latest Patents

Hiroshi Date's latest patents include a fault diagnosis system, fault diagnosis device, fault diagnosis method, program, computer-readable medium, and device under test. One notable patent describes a fault diagnosis method that utilizes a fault diagnosis system for diagnosing a photovoltaic module by estimating a fault location. This system includes a signal generator that inputs an input signal into the photovoltaic module, a waveform observer that observes a reflected output signal, and a diagnosis unit that estimates the fault location based on the output signal. The method involves controlling the positions of the conductive body and/or the photovoltaic module, observing the output signal, and estimating the fault location based on two reflected output signals.

Another significant patent is a conversion device and method that converts an initial test pattern into a test pattern of different logic values without losing fault coverage of transition delay faults. This conversion device includes a decision means for determining a combination of logic values in the initial test pattern that meets the detection condition of faults in the logic circuit.

Career Highlights

Hiroshi Date has worked with notable organizations such as System Jd Co., Ltd. and the Japan Science and Technology Agency. His experience in these companies has allowed him to develop and refine his innovative ideas in fault diagnosis technology.

Collaborations

Hiroshi has collaborated with esteemed colleagues, including Seiji Kajihara and Kohei Miyase. Their joint efforts have contributed to advancements in the field of fault diagnosis.

Conclusion

Hiroshi Date is a distinguished inventor whose work in fault diagnosis systems has made a significant impact on technology. His innovative patents and collaborations highlight his dedication to advancing the field.