The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Dec. 29, 2008
Seiji Kajihara, Fukuoka, JP;
Kohei Miyase, Fukuoka, JP;
Xiaqing Wen, Fukuoka, JP;
Yoshihiro Minamoto, Fukuoka, JP;
Hiroshi Date, Fukuoka, JP;
Seiji Kajihara, Fukuoka, JP;
Kohei Miyase, Fukuoka, JP;
Xiaqing Wen, Fukuoka, JP;
Yoshihiro Minamoto, Fukuoka, JP;
Hiroshi Date, Fukuoka, JP;
Japan Science & Technology Agency, Saitama, JP;
Kyushu Institute of Technology, Fukuoka, JP;
System JD Co., Ltd., Fukuoka, JP;
Abstract
Provided are a conversion device and the like for converting a initial test pattern given in advance into a test pattern of a bit constitution of different logic values, without losing the fault coverage of transition delay fault which can be detected by the constitution element of the initial test pattern. The conversion device converts an initial test patterngiven in advance for a logic circuit into an intermediate test patternof a bit constitution of different logic values, where the constitution elements of the initial test patternare at least two test vectors applied in succession. The conversion device includes a decision means for deciding a combination of logic values in the initial test patternwhich meet a detection condition of faults of the logic circuit which can be detected by applying the constitution elements.